Improved technique for measuring complex reflection coefficients of microwave devices using only two power detectors

The paper describes an improved technique for measuring the complex reflection coefficients of microwave devices using the four-port multi-state reflectometer (which requires two power detectors and other commonly-available laboratory components). Simulation and experimental tests have confirmed that the prototype instrument (implemented in waveguide form) is able to yield measurement accuracies of within /spl plusmn/0.01 for magnitude and /spl plusmn/1/spl deg/ for phase.