A lumped-circuit study of basic oscillator behavior

This paper presents an experimental study of the oscillations set up in a circuit consisting of a negative conductance and a multiple-resonant load. Its purpose was to verify that such a circuit can account for many of the irregular phenomena commonly observed during tuning of practical microwave solid-state oscillators; such effects as discontinuous frequency changes, low circuit Q-factors, power variations, spurious oscillations and noise conditions are all readily reproduced in a simple low-frequency analogue. There is close correspondence with a first-order analysis.