Abstract:
We present a coherent, continuous-wave terahertz materials characterization platform enabling THz spectroscopy and characterization of chemical, electronic and magnetic s...Show MoreMetadata
Abstract:
We present a coherent, continuous-wave terahertz materials characterization platform enabling THz spectroscopy and characterization of chemical, electronic and magnetic samples from 5 K to 300 K and in fields up to 9 T.
Published in: 2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)
Date of Conference: 01-06 September 2013
Date Added to IEEE Xplore: 21 November 2013
Electronic ISBN:978-1-4673-4717-4
Contents 