I/sub DD/ waveforms analysis for testing of domino and low voltage static CMOS circuits

This paper describes a test method which relies on the actual observation of supply current (I/sub DD/) waveforms. The method can be used to supplement the standard I/sub DDQ/ test method and it can be easily applied to dynamic and low V/sub DD/, low V/sub T/ CMOS circuits. The method allows us to detect faults which may not be detected by I/sub DDQ/ test methods, and is sensitive enough to detect potential faults, which do not manifest themselves as functional errors. A simple built-in current sensor, which proves to be adequate in verifying the feasibility of using the I/sub DD/ waveforms analysis is proposed to safely observe the current waveforms without significantly changing the waveforms.