The very unusual case of the IEC-robust IC with low HBM performance

In this work we will show for the first time the case of an IC robust to on-chip IEC 61000-4-2 ESD level events and, yet, consistently failing at low HBM levels (<;2KV). The causes for the miscorrelation will be investigated in detail. A more reliable indicator for HBM robustness will be indicated.