Diagnostics forz-pinch on PTS facility

Summary form only given. An extensive diagnostics with spatial and temporal resolution for Z-pinch was developed on the PTS facility at Key Labora tory of Pulsed Power, CAEP. PTS facility can generate a curr ent rising to 8-10 MA in 90 ns, which was used to drive wire array Z pinches. Diagnostics including soft X-ray power meter, DANTE, transmission grating spectrometer, time-resolved X-ray pinhole camera, optical/X-ray streak cameras, X-ray crystal spectrometer, laser differential interferometer and some experimental results are described in this paper.