Ef3S: An evaluation framework for flash-based systems

NAND Flash memories are gaining popularity in the development of electronic embedded systems for both consumer and mission-critical applications. NAND Flashes crucially influence computing systems development and performances. EF
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S, a framework to easily assess NAND Flash based memory systems performances (reliability, throughput, power), is presented. The framework is based on a simulation engine and a running environment which enable developers to assess any application impact. Experimental results show functionality of the framework, analysing several performance-reliability tradeoffs of an illustrative system.