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3D Integration of CMOS image sensor with coprocessor using TSV last and micro-bumps technologies | IEEE Conference Publication | IEEE Xplore

3D Integration of CMOS image sensor with coprocessor using TSV last and micro-bumps technologies


Abstract:

This paper presents the prototype of a 3D circuit in which a Wafer Level Packaged CMOS image sensor is vertically assembled with an image signal processor in a face-to-ba...Show More

Abstract:

This paper presents the prototype of a 3D circuit in which a Wafer Level Packaged CMOS image sensor is vertically assembled with an image signal processor in a face-to-back integration scheme. The design flow used to hybrydize the two circuits will be fully described, up to physical implementation. The process technology carried out will be presented in a 200 mm environment. Finally, the 3D assembly will be successfully assessed, concretising the realism of a 3D technology for nomadic imaging systems.
Date of Conference: 28-31 May 2013
Date Added to IEEE Xplore: 08 August 2013
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Conference Location: Las Vegas, NV, USA

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