A bottom-up search technique of manufacturing indicators stmicroelectronics' case study

This paper proposes a bottom-up search technique to enhance the retrieval of manufacturing information resources in semi-conductor industries. These resources mainly provide manufacturing indicators for the control of the manufacturing processes. The search technique is based on a semantic mapping approach supported by a manufacturing process ontology and a process control dictionary. The ontology and the dictionary provide the required semantics to find out the purpose of use of the manufacturing indicators in the control process. In this way, the proposed search technique enables the end user (the engineer) to explore the resource repositories in the company and to understand the usefulness of the resources found, so to reuse the adequate indicators for the control process. The general approach has been experimented within the STMicroelectronics Company and has shown promising results.