An automated system for testing readout electronics of silicon strip x-ray detectors

We present the DEDIXtest system, which is a tool for testing DEDIX chip - a 64-channel application specific integrated circuit (ASIC) designed for readout of silicon strip detectors used in X-ray imaging applications. For communication with ASIC we use the commercially available interface board featuring a real-time processor and a set of digital inputs and outputs controlled by a field programmable gate array. This application features a user interface module, which allows convenient definition of tasks for the program and clear presentation of measurement results. For validation of the developed software we performed a set of simple tests for each of the implemented procedures, using X-ray tubes applied in diffractometers.