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Temporary bonding/de-bonding and permanent wafer bonding solutions for 3D integration | IEEE Conference Publication | IEEE Xplore

Temporary bonding/de-bonding and permanent wafer bonding solutions for 3D integration


Abstract:

Thin wafer handling (or temporary bonding/de-bonding) and permanent wafer bonding are two of the key enabling technologies for 3D-IC integration process. Temporary bondin...Show More

Abstract:

Thin wafer handling (or temporary bonding/de-bonding) and permanent wafer bonding are two of the key enabling technologies for 3D-IC integration process. Temporary bonding adhesive in conjunction with de-bonding method has to be carefully selected to obtain damage-free thinned processed wafers. Room temperature mechanical lift-off de-bonding method with proper de-bond wave front control is considered to be promising. Metal-adhesive or metal-oxide hybrid bonding can create a final stacked 3D-IC structure with superior mechanical strength, electrical performance and excellent post-bond alignment.
Date of Conference: 10-12 December 2012
Date Added to IEEE Xplore: 06 June 2013
ISBN Information:
Conference Location: Kyoto, Japan

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