Techniques of improved signal extraction in scan conversion-based transient digitizers

This paper deals with a technique to improve the signal extraction from the target diode matrix of scan conversion-based transient digitizers. The target charge distribution corresponding to the input signal is analyzed through statistical-based techniques. The identification of the distribution model allows main distortion effects to be identified and corrected. Experimental results of tests carried out on an actual scan converter using dc and sine wave signals showed that signal extraction can be improved mostly by correcting the center displacement of the column distributions.