Highly accelerated life testing of LED luminaries

With rapid development of lighting emitting diode (LED) market, more people are focusing on reliability testing method of LED luminaries system. Based on the previous exploration, to assess the whole system reliability with a fast way, authors propose to divide the system into several subsystems, and then carry out step stress accelerated testing (SSAT) to get failure mechanism and reliability distribution of each subsystem, finally calculate the life distribution of the whole system by combining with system statistics analysis methodologies.