Testing wireless transceivers' RF front-ends utilizing defect-oriented BIST techniques

In modern nanotechnologies, the testing of embedded wireless transceivers' RF front-ends is a great concern. The test technique presented in this work is based on dedicated built-in self test (BIST) structures for each building block of the transceiver. These BIST circuits utilize defect-oriented test techniques. Experimental results on a CMOS transceiver design are discussed to accentuate the efficiency of the proposed scheme.