Development of Multiharmonic Verification Artifact for the LSNA and NVNA (MTT-11)

In this article, a unique approach is presented to design and fabricate a circuit, rich in nonlinear contents with reduced sensitivity to bias, temperature, and load variations so that it can be used to validate the performance of LSNAs or NVNAs. This circuit was judged to be a joint winner in the 2012 IEEE MTT-S International Microwave Symposium (IMS2012) Student Design Competition, Design of a Calibration Verification Artifact for Nonlinear VNA, sponsored by MTT-11 Microwave Measurements.