Ba(X1/3Ta2/3)O3 complex perovskites for microwave and millimeter-wave applications

Ba(X
_1/3
Ta
_2/3
)O
₃
(X=Zn, Mg) perovskites were prepared by using the solid state reaction method. X-ray diffraction and scanning electron microscopy were employed for structural and morphological characterization of Ba(X
_1/3
Ta
_2/3
)O
₃
samples. The dielectric constant of the resonators was 28 for Ba(Zn
_1/3
Ta
_2/3
)O
₃
and 24 for Ba(Mg
_1/3
Ta
_2/3
)O
₃
. A strong influence of the cation ordering on the dielectric loss has been found. The achieved values of Q × f product, ranging from 100 to 200 THz, make Ba(X
_1/3
Ta
_2/3
)O
₃
dielectric resonators attractive for microwave and millimetre-wave applications.