Parameterizable testing scheme for FIR filters

This paper presents a new pseudo-exhaustive test methodology for digital finite impulse response (FIR) filters. The proposed scheme can be employed in a built-in self-test (BIST) environment to detect any combinational faults occurring in linear phase comb filters, trees of sign-extended adders and phase-shift multipliers. It uses additive generators as a source of pseudo-exhaustive patterns to test systematically all FIR filter building blocks.