Thin film resistor technology and noise reliability indicators

Low-frequency noise reliability indicator C/sub Q/=S/sub u/f/U/sup 2/ for thin film resistors is introduced and its applicability is demonstrated with the use of experimental data. Dispersions of the noise reliability indicator and frequency exponent of large ensembles of resistors manufactured by Japanese, US and European producers are compared with the aim to assess the production technology level. Correlation of results is presented.