Resistive switching characteristics of patterned Cr/ZnO/Cr thin film structure

Current-voltage (I-V) characteristics of the Cr/ZnO/Cr capacitor structure was investigated. A bipolar resistive switching behavior was observed in the patterned structure of Cr/ZnO/Cr. In addition, using Cr coated AFM tip as a top electrode, the electrical characteristics of local area of ZnO/Cr structure was measured and compared with that of capacitor structure.