Determination of the quantized hall resistance value by using a calculable capacitor at ETL

We report the International System (SI) value of the quantized Hall resistance (R
H
) determined by using a calculable capacitor at the electrotechnical laboratory (ETL). As the result of our measurements at ETL, a most reliable value of h / e
²
has been estimated as 25 812.8036 Ω
SI
with a systematic uncertainty of 0.25 ppm root sum square (rss) and a random error of 0.20 ppm one standard deviation (1σ).