An Infrastructure for Analog Circuits Testing

This paper presents an infrastructure for analog circuits testing. The proposed infrastructure is designed by the concept of the switch-current (SI) circuit. Two operating modes, which are loading mode and observing one, are used to complete the associated testing procedure. This proposed infrastructure is digitally controlled by switches and a capacitor is used to store the associated analog voltage level. Then the infrastructure can be extended to accomplish a wider range of analog signal. Simulation results also demonstrate the effectiveness of the proposed infrastructure for analog circuit testing.