Integration of 4F2 selector-less crossbar array 2Mb ReRAM based on transition metal oxides for high density memory applications

4F
²
selector-less crossbar array 2Mb ReRAM test chip with 54nm technology has been successfully integrated for high cell efficiency and high density memory applications by implementing parts of decoders to row/column lines directly under the cell area. Read/write specifications for memory operation in a chip are presented by minimizing sneak current through unselected cells. The characteristics of memory cell (nonlinearity, Kw >8, Iop <10uA, Vop <3V), TiOx/Ta
2
O
5
, are modified for its working in a chip by adopting appropriate materials for a resistor stack and spacer. Write condition in a chip makes a critical impact on read margin and read/write operation in a chip has been verified.