Diode particle simulations in 2-D and 3-D geometries by using LSP and MCNP code

When test explosives are irradiated by flash X-ray, the dynamic properties can be analyzed by observing crack progress and fracture movement. Our radiographic device has a self-magnetic pinched(SMP) diode to generate flash X-ray. To optimize diode performance the SMP diode is simulated with the combination of LSP and MCNP code. The electron particle data are extracted at anode position of the diode by LSP particle-in-cell(PIC) code. When these electrons collide with the tantalum target Bremsstrahlung photons are produced, which can be calculated by the MCNP Monte-Carlo code. We discovered some of 2-D simulation results did not matched real situation, that is, electron energy spectra had a too high energy tail and electron spatial distribution was excessively focused at the axis of anode position. We tried the 3-D diode simulation and compared the results with that of 2-D geometry.