Effective WIP dependent lot release policies: A discrete event simulation approach

In this paper we explore a lot release policy for wafer fabs that is based on the WIP threshold of the bottleneck station. Our results show that this policy is effective in cycle time improvement while keeping the same level of throughput compared with a case where no policy is applied. The application of this policy is practical and needs less considerations compared to policies that aim at keeping the WIP constant throughout the fab.