Design of a MGy tolerant instrumentation amplifier using a correlated double sampling technique in 130 nm CMOS

In this paper a radiation tolerant configurable instrumentation amplifier for use with resistive sensors, like strain gauge pressure sensors, is presented. The design features a 1.5 V differential amplifier, consuming 1.5 mW and utilizing a correlated double sampling technique (CDS) with a sample frequency of 20 kHz. The gain of the amplifier is digitally configurable between 27 and 400 and the input referred noise density equals 8.6 μV at room temperature. The circuit has a simulated radiation tolerance exceeding 1 MGy.