CMOS low current measurement system for nanopore sensing applications

We present a 16 channel micro-chip implementation of a low current measurement system for use in automated nanopore sensing applications using capacitive feedback. We successfully used our device to perform voltage-clamping and current measurement across specially designed nanopores for low voltage sensing to detect the presence of nanoparticles. Nanoparticle events in the pore can be seen as transient changes in current from the standing current. We demonstrate our system by detecting events from 2 ms to 50 ms with a 250 pA to 350 pA change from the baseline current.