Improved lumped charge model for high voltage power diode and automated extraction procedure

The “lumped charge” power diode compact model [1] is extended including impact ionization while maintaining the low computational cost. The new model can better reproduce the shape of the current peak during reverse recovery, allowing for more predictive EMI/EMC simulations. The parameter extraction procedure is also improved and automated through multi-objective genetic algorithms, resulting in very good agreement between model and measurements. Finally, calibrated TCAD simulations are used to understand the limitations of the compact model.