Expanding the frequeny range for DPI testing of IC's above 1 GHz: An alternative proposal

Characterizing Integrated Circuits (IC's) against immunity may be done in different ways, as defined in the set of standards EN IEC 62132-x. Especially, the subpart EN IEC 62132-4 defines a test setup called Direct RF Power Injection method (DPI) and is specified for the frequency range from 150 kHz up to 1 GHz. Although it is a well defined measuring method, problems are occurring above 10 MHz in order to estimate the right immunity level of the IC under test. In more, it should be of great interest to have the method available above the frequency limit of 1 GHz. In this paper, a test setup is proposed to overcome both requirements.