Ultrafast optoelectronic technology for radio metrology applications

Ultrafast optoelectronic technology has been widely used in terahertz time domain spectrum, terahertz imaging technology, terahertz communication and so on, and great progress has been achieved in the past two decade. Recently, this innovative technology has been applied in radio metrology and supplied a potential and hopeful method to solve the existent challenges of calibration devices and equipments with bandwidth up to 100 GHz. This paper generally summarizes the emerging applications of the ultrafast optoelectronic technology in radio metrology. The main applications of this technology in calibrating broadband sampling oscilloscopes, the high-speed photodiodes and calibrating the electrical pulse generators are emphasized, and the testing of monolithic microwave integrated circuits is also presented.