A new method for estimating the aperture uncertainty of A/D converters

Aperture uncertainty measurements are strongly influenced by quantization, converter nonlinearity and test setup noise. An original method is here proposed which completely solves the difficulties arising from quantization and nonlinearity. The method estimates the noise distribution function by finely varying the input signal offset. The applicability of the method is proved by the experimental results obtained on 8 and 10 bit converters.