Evaluating the impact of DFM library optimizations on alpha-induced SEU sensitivity in a microprocessor core

This paper presents and discusses the results of Alpha Single Event Upset (SEU) tests on an embedded 8051 microprocessor core implemented in three different cell libraries. Each standard cell library is based on a different Design For Manufacturability (DFM) optimization strategy; our goal is to understand how these strategies may affect the device sensitivity to alpha-induced Soft Errors. The three implementations are tested exploiting advanced Design for Testability (DfT) methodologies and radiation experiments results are compared.