A CMOS integrated system for SEE-induced transients acquisition

We present the design and operation of a monitor circuit that captures the effect of ionizing particles on sensitive CMOS IC internal nodes. The circuit implements a Single Event Effects (SEE) detector and a quick sampling block that captures the SEE induced waveform shape currents during a certain time window. These values can be read externally through a dedicated decoding circuitry. The circuit has been designed and fabricated on a 130 nm technology. Preliminary experimental results and detailed simulations are provided to demonstrate the feasibility of the system implemented.