1/ƒ noise in ZnO films

We have investigated the low-frequency noise of ZnO film deposited by dc sputtering technique on glass substrate. We characterized the noise below 100kHz and obtained classical 1/f spectra. We attempted to verify the validity of Hooge's empirical relation and to test its usefulness as a diagnostic tool. The 1/f noise normalized for bias, frequency and unit area, C
_us
is proportional with the sheet resistance R
_sh
. We found that the noise results depend strongly on illumination.