A Novel Microwave Tomography System Based on the Scattering Probe Technique

In this paper, we introduce a novel microwave tomography system, which utilizes 24 double-layered Vivaldi antennas, each of which is equipped with a diode-loaded printed-wire probe. By biasing the probe's diodes, the impedance of the probe is modified, allowing an indirect measurement of the electric field at the probe's locations. Each printed-wire probe is loaded with five equally spaced p-i-n diodes, in series. We show that electric field data collected in this way within the proposed tomography system can be used to reconstruct the dielectric properties of an object of interest. Reconstructions for various objects are shown. Although the results are still preliminary, sufficient experimentation has been done to delineate the advantages of such an indirect method of collecting scattered-field data for tomographic imaging purposes.