Workshop on merging fields of computational intelligence and sensor technology (IEEE CompSens 2011)

The workshop CompSens will bring together researchers, engineers, practitioners, and students from the fields of sensor technology (ST) and computational intelligence (CI) in order to cross-fertilize and to initiate possible collaborations between these fields. ST researchers in the sensor fields will have the opportunity to enhance their CI background, and CI researchers will gain valuable feedback on the problems and the needs for “real world” applications. Sensor technology is the gate that connects computational intelligence to the real world and understanding and awareness of ST issues is important for meaningful developments of CI. Among others, CI is also more and more used to algorithmically support the quality of ST and its outcomes. Sufficient knowledge and experience in these fields is a timely effort and there is naturally a gap between theoretical research of CI and its applications to “real-world” problems. Research in CI is often conducted by data sets that leak important aspects of real world measurement. Drift, hysteresis, calibration error, sensitivities, cross selectivity, are only a few parameters mentioned which falsify the results but does not yet get many attention in most CI algorithms. On the other side, ST researchers are going to apply more and more computational intelligence for steadily growing multi sensor set-ups to gain a “plus” out of large sets of electronically obtained data. However, often there is still a lack in experience or knowledge of how to use and optimize the CI algorithms correctly. Mostly, algorithms get simply applied in one or the other form that a software toolbox is offering without deep analysis of the possible advantages or disadvantages of the method for a particular task. Accepted papers to IEEE CompSens 2011 are works that present achievements related to the merge of sensor technology and computational intelligence and that contribute to the cross-fertilization of the ST and CI fields.