Sequential multi sliced X-ray CT by using vertical projection for high speed CT

The traditional X-ray CT measurement takes long time to construct scanning image, because X-ray sources and detectors are revolved around objects to get over 180 projection data for reconstructing an inner structures image of objects. For this reason, X-ray CT scan system has been hardly used in high throughput fields. In this paper, we proposed new method to reduce scanning time by using vertical projection data. Moreover, we discuss the effect of dual energies X-ray CT for material discrimination by this method.