An analytical method for correcting images obtained with Scanning Tunneling Microscopes

An analytical method for the correction of images obtained through Scanning Tunneling Microscopy (STM) is presented. The method is based on the analysis of the Discrete Fourier Transform (DFT) of the experimental STM images. A transformation matrix in the Fourier plane is derived from the comparison of the DFT of the experimental images with the DFT of the ideal STM image; this transformation is then applied to correct the experimental images. This kind of procedure is shown to be suitable also for the evaluation of repeatability of the instrument performance.