Installation for investigation of electron beams of vacuum electronic devices of millimeter-wave band

Output characteristics and parameters of electronic devices greatly depend on the properties of electron beams (EB) which transfer and transform the energy. In this case the information concerning exact space configuration and microstructure of the beam is of paramount importance and can be received only by use of experimental methods of diagnostics based on different physical phenomena. During the last years attention of investigators has been attracted by transient radiation which can be used effectively enough for diagnostics of EB.