Total ionizing dose (TID) evaluation results of low dose rate testing for NASA programs

Low dose rate radiation testing in the range of 0.01-0.20 rads(Si)/s has been performed at Goddard Space Flight Center on a wide variety of non-RH (rad-hard) part types in the last few years. This paper reports on recent test results of EEPROMs, Operational Amplifiers, Analog-to-Digital Converters (ADCs) and Digital-to-Analog Converters (DACs), and DC-DC converters. These results have shown that non-RH parts are suitable for many low earth orbiting satellites, where predicted mission total dose requirements may be in the range of 0.5-10 krads(Si). However, a careful characterization of non-RH parts should be performed to verify that the parts meet the requirements of their intended application in the projected mission radiation environment.