Filter-Less Amplification for Rapid Swept-Wavelength Interferometric Measurement of Silicon Waveguide Group Delay Statistics

In the context of rapid and high-resolution swept-wavelength interferometric measurement of dispersion properties of silicon nanophotonic devices, we show that filter-less optical amplification does not perturb the measured statistical distributions of group delay. The scaling behavior of group delay ripple with detected power is also shown to be identical for the unamplified and filter-less amplified cases.