A 300-A delta V/sub F/ tester

The design and development of a relatively low-cost, high-current, transient thermal resistance tester are described. The tester, which employs delta techniques, was initially used to measure the die bond integrity of large power handling rectifier assemblies, but because of its versatility it can thermally characterize most semiconductor junctions. Circuit design details and testing of several products are illustrated, including the delta V/sub F/ and V/sub F/ measurements of power rectifiers and smart power ICs.<
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