Effect of aggressor driver width on crosstalk for static and dynamic switching of victim line

In DSM technology, unintended interactions between signals propagating through interconnect turn out to be critical design concern. At technology nodes below 0.25μm, the performance and correctness of a design cannot be assured without considering noise effects. In integrated circuits, the main cause of signal integrity problems is crosstalk. This paper presents the effects of aggressor driver width variation on crosstalk noise in RLC coupled interconnects for static and dynamic switching of victim line. To demonstrate these effects, two distributed RLC interconnects coupled inductively and capacitively are taken into consideration. The length of interconnect is taken as 4mm and far end capacitive loading is 30 fF. The SPICE waveforms are generated at far end of victim line for varying width of aggressor driver PMOS from 20μm to 120μm in steps of 20μm. The corresponding NMOS width is half of PMOS. The victim driver width is kept fixed at 40μm for PMOS and 20μm for NMOS. The simulation is carried out at 0.13μm, 1.5V technology node. Three different cases of input switching are considered. It is observed that level of crosstalk noise for static and dynamic switching of victim line increases with driver width.