Characteristics of application of impulse reflectometry in investigation of ultra-wideband circuits

Features of impulse reflectometry of the sub-nanosecond range are considered. The influence of parameters of a probing signal in the ultrabroadband nonuniform systems on the results of measurements is analyzed. An algorithm of processing of measurement data that allows accounting of the shape of the probing signal and numerous reflections, originating from nonuniform systems, is proposed.