Model-based synthesis of reactive planning on-line testers for non-deterministic embedded systems

We describe a method and algorithm for model-based construction of an on-line reactive planning tester (RPT) for black-box testing of embedded systems specified by non-deterministic extended finite state machine (EFSM) models. The key idea of RPT lies in off-line learning of the System Under Test (SUT) model to prepare the data for efficient on-line reactive planning. A test purpose is attributed to the transitions of the SUT model by a set of Boolean conditions called traps. The result of the off-line analysis is a set of constraints used in on-line testing for guiding the SUT towards taking the moves represented by trap-labeled transitions in SUT model and generating required data for inputs. We demonstrate the results on a simple example and discuss the practical experiences of using the proposed method.