Low energy proton implantation techniques for coverglass irradiation qualification

It is demonstrated that the two hydrogen concentration profiles and the associated effects on solar cell coverglass degradation created at equivalent atomic fluences of 7.4×10
¹⁵
particles/cm
²
using 30 keV proton (H
⁺
) and 60 keV diatomic hydrogen ion (H
₂
⁺
) implantation on solar cell coverglass material are nearly identical. Both Monte Carlo simulation and experimental results support this contention to the level of acceptable experimental error, thereby enabling coverglass radiation testing to be performed using the latter, more cost effective option.