Origin of “current-onset voltage” variability in scaled MOSFETs

Present work analyzes the cause of “current-onset voltage” variability, which has been newly found to largely affect drain current variability. It is found by 3D device simulation that the “current-onset voltage” variability is determined by how largely the channel potential fluctuates by random dopant disposition. Reducing RDF will suppress both threshold voltage and current-onset voltage variability as well.