Application of a statistical compact model for Random Telegraph Noise to scaled-SRAM Vmin analysis

A statistical compact RTN (Random Telegraph Noise) model with a fixed V
_th
shift and V
_gs
dependent trap time constants is proposed. It accurately reproduces the experimental observation of larger V
_th
fluctuation at higher |V
_gs
|. The model is also applied to analysis of SRAM V
_min
fluctuation and finds out the distribution follows a log-normal statistics.