BICS-based March test for resistive-open defect detection in SRAMs

Nowadays, embedded Static Random Memories (SRAMs) can occupy a significant portion of the chip area and contain hundreds of millions of transistors. Due to technology scaling, functional fault models traditionally applied in SRAMs' testing have become insufficient to correctly reproduce the effects caused by some defects generated during the manufacturing process. In this paper, we investigate the possibility to use Built-In Current Sensors (BICSs) in combination with an optimized March algorithm to detect static faults associated to resistive-open defects. Experimental results obtained throughout electrical simulations validate the proposed technique demonstrating its viability and effectiveness.