Effect of body biasing on embedded SRAM failure

This paper studies the tradeoffs when using body biasing as a power consumption modulator for Static Random Access Memories (SRAM) in term of reliability versus power consumption. We show that for fault tolerant applications such as wireless applications and multimedia, utilizing body biasing combined with voltage scaling can result in up to 47% power saving compared to the nominal case, while, for the same scenario, utilizing only voltage scaling will result in 20% power saving in the memory compared to nominal case.