DC and RF cryogenic behaviour of InAs/AlSb HEMTs

DC and RF properties are reported for InAs/AlSb HEMTs operating under cryogenic conditions (6 K) for a drain source bias up to 0.3 V. Compared to room temperature (300 K), a large improvement in device properties was observed: lower R
_on
, lower g
_ds
, a more distinct knee in the I
_ds
(V
_ds
) characteristics, increased f
_T
and a reduction of the gate leakage current of more than two orders of magnitude. This makes InAs/AlSb HEMT technology of large interest in cryogenic low-noise amplifier designs with high constraints on power dissipation.